Atomic Force Microscopy

A Bruker Dimension Fastscan AFM provides atomic force microscopy in both air and fluids using the new “Peak Force” tapping mode as well as very high speed resonant tapping mode. In addition to the usual height and phase images, this instrument can calculate and map mechanical properties such as stiffness, modulus, and adhesion, with sample sizes as large as 200 mm. The Kelvin probe attachment can measure and map surface potential. Detailed specifications of the Fastscan AFM can be found here. The AFM is equipped with both “Fastscan” and “Icon” scanning heads. The Fastscan head is easier to use and (of course) faster, while the Icon head has a larger range in X, Y and Z.