Evolving Atomic-resolution Scanning Probe Microscopy: Towards Quantitative, Chemically Selective 3D Imaging

Despite the evolution of scanning probe microscopy (SPM) into a powerful set of techniques that image surfaces and map their properties down to the atomic level, significant limitations in both imaging and mapping persist. Currently, typical SPM capabilities qualitatively record only one property at a time and at a fixed distance from the surface. Furthermore, the probing tip’s apex is chemically and electronically undefined, complicating data interpretation. To overcome these limitations, we started to integrate significant extensions to existing SPM approaches. First, we extended noncontact atomic force microscopy with atomic resolution to three dimensions by adding the capability to quantify the tip-sample force fields near a surface with picometer and piconewton resolution. Next, we gained electronic information by recording the tunneling current simultaneously with the force interaction. We then moved on to study the influence of tip chemistry and asymmetry on the recorded interactions. Applications to metal oxides are presented. From this platform, we present our vision of a method capable of characterizing full atomic-scale chemical and electronic properties.