The Hitachi IM4000 can be used for cross-sectioning samples (usually for SEM viewing) or for polishing surfaces. This ion mill uses a knife edge to mask the ion beam, creating a straight cut. The sample stage is easily reconfigured for polishing the sample, by milling at a glancing angle. The polishing mode can also be used for thinning TEM samples. Operating at up to 6kV, the ion current is much higher than that of the Fischione 1050, but the spot size is also much larger. More details and specifications can be found here.