Transmission Electron Microscopy

The FEI Tecnai Osiris 200kV TEM is a new type of microscope specifically configured for material science. While the software and electron optics share a great deal with the latest TEMs found in the Yale Medical School, the Osiris is equipped with a new type of high-brightness electron source and a new high-area solid-angle x-ray detector, making possible real-time spectral imaging. Another type of spectral analysis is provided by an electron engergy-loss spectrometer. This new generation of electron microscope is operated from a remote console, making use of motorized apertures and high-resolution video cameras to keep human operators removed from the sensitive electron optics. In support of TEM sample preparation, the YINQE laboratory is also equipped with a Fischione 1050 ion-beam thinning tool, a focussed ion-beam instrument, and a cryo-microtome (see below).

Point resolution  0.25 nm
Information limit 0.14 nm
Spherical aber. coef. 1.2 mm
Chromatic aber. coef. 1.1 mm
Maximum tilt ±30
Brightness @200kV

1.8e9 A/cm²srad

EDX resolution 136 eV