The FEI Tecnai Osiris 200kV TEM is specifically configured for material science. While the software and electron optics share a great deal with the 200kV TEMs found in the Yale Medical School, the Osiris is equipped with a new type of high-brightness electron source and a new high-area solid-angle x-ray detector, making possible high-speed spectral imaging. This new generation of electron microscope is operated from a remote console, making use of motorized apertures and high-resolution video cameras to keep human operators removed from the sensitive electron optics. In support of TEM sample preparation, the YINQE laboratory is also equipped with a Fischione 1050 ion-beam thinning tool, a focussed ion-beam instrument, and a cryo-microtome (see below).
|Spherical aber. coef.
|Chromatic aber. coef.