The FEI Tecnai Osiris 200kV TEM is specifically configured for material science. While the software and electron optics share a great deal with the 200kV TEMs found in the Yale Medical School, the Osiris is equipped with a new type of high-brightness electron source and a new high-area solid-angle x-ray detector, making possible high-speed spectral imaging. This new generation of electron microscope is operated from a remote console, making use of motorized apertures and high-resolution video cameras to keep human operators removed from the sensitive electron optics. For sample preparation, YINQE is equipped with a Leica cryo-microtome. A focussed-ion beam instrument is available on West Campus.
| Point resolution | 0.25 nm |
| Information limit | 0.14 nm |
| Spherical aber. coef. | 1.2 mm |
| Chromatic aber. coef. | 1.1 mm |
| Maximum tilt | ±30 |
| Brightness @200kV |
1.8e9 A/cm²srad |
| EDX resolution | 136 eV |