Two Hitachi SU-70 scanning electron microscopes provide 1 nm resolution with a high-brightness electron source. Both SEM instruments accelerate electrons from 0.5 to 30 kV, and...
A microtome makes possible the sectioning of soft material for TEM analysis. Acessories for the Leica Ultra UC7 include a trimming mill and a glass knife maker.
Iridium is useful for coating samples before electron microscopy. The Cressington 208 iridium sputtering tool provides very smooth, conformal coatings which are free of the...
The Hitachi IM4000 can be used for cross-sectioning samples (usually for SEM viewing) or for polishing surfaces. This ion mill uses a knife edge to mask the ion beam, creating...
