Equipment

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For a detailed list, please click here at research.yale.edu/cores/yinqe.

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Scanning electron microscopy: Hitachi SU-70 SEM w/ Oxford EDS Ultim Max Infinity 170

Transmission electron microscopy: FEI Tecnai Osiris 200kV TEM

Electron-beam lithography: Raith EBPG 5000+ and EBPG 5200+

Atomic force microscopy: Bruker Dimension Fastscan AFM

X-ray diffractometry: Rigaku Smartlab XRD

Ion mill: Hitachi IM4000 

Ir sputter: Cressington 208HRD

Microtome: Leica Ultra UC7 

Stylus profilometer: Bruker Dektak XT

Transmission Electron Microscopy

The FEI Tecnai Osiris 200kV TEM is specifically configured for material science. While the software and electron...

Scanning Electron Microscopy

Two Hitachi SU-70 scanning electron microscopes provide 1 nm resolution with a high-brightness electron source. Both SEM instruments accelerate electrons from 0.5 to 30 kV, and...

Microtome

A microtome makes possible the sectioning of soft material for TEM analysis. Acessories for the Leica Ultra UC7 include a trimming mill and a glass knife maker.

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Cressington 208 iridium sputtering tool

Iridium is useful for coating samples before electron microscopy. The Cressington 208 iridium sputtering tool provides very smooth, conformal coatings which are free of the...

Hitachi IM4000 ion mill

The Hitachi IM4000 can be used for cross-sectioning samples (usually for SEM viewing) or for polishing surfaces. This ion mill uses a knife edge to mask the ion beam, creating...